We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for MS analysis.
ipros is IPROS GMS IPROS One of the largest technical database sites in Japan that collects information on.

MS analysis Product List and Ranking from 4 Manufacturers, Suppliers and Companies | IPROS GMS

MS analysis Product List

1~6 item / All 6 items

Displayed results

TOF-SIMS analysis of organic matter

As an example of organic matter analysis, I would like to introduce a case where polyethylene glycol was analyzed.

TOF-SIMS can detect elements and organic molecules, as well as fragment ions, making it effective for organic analysis. As an example of organic analysis, we will introduce a case study of polyethylene glycol. Secondary ion mass spectra can provide valuable insights for the qualitative analysis of organic substances. In this case study, we can confirm the characteristic repeating structure of polyethylene glycol (C2H4O) as a peak group with a mass difference of 44. Calculating from the mass number, it is inferred that the terminal groups are H- and HO-, suggesting they are detected as protonated species. *For more details, please refer to the PDF document or feel free to contact us.*

  • Contract Analysis
  • Contract Inspection
  • Contract measurement
  • MS analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

TOF-SIMS analysis of trace contaminants

The analysis sensitivity of TOF-SIMS is high at the ppm level, making it effective for analyzing trace contamination!

This is an introduction to a case where water droplet-shaped contaminants were created on a Si wafer through reproducibility experiments. Measurements were conducted at the same position using SEM-EDX and TOF-SIMS, and a comparison of the image maps was made. In the TOF-SIMS image map, organic substances (CH, CN), Na, and K were detected around the watermark. While no contaminants were observed around the watermark in the optical image, SEM image, and EDX analysis, the TOF-SIMS image map revealed that trace amounts of contaminants were present. *For more details, please refer to the PDF document or feel free to contact us.*

  • 2020-05-28_17h35_40.png
  • 2020-05-28_17h35_42.png
  • 2020-05-28_17h35_48.png
  • Contract Analysis
  • Contract Inspection
  • Contract measurement
  • MS analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Pyrolysis GC/MS analysis (structural estimation of resin, identification of volatile components)

For material identification analysis such as polymer structure estimation and volatile component identification!

We would like to introduce the "Pyrolysis GC/MS Analysis" conducted by Ronbic Co., Ltd. We can analyze a variety of materials in different forms, from liquids to solids, including plastics, rubber, wood, fibers, paints, inks, adhesives, and oils. By directly introducing the sample and performing pyrolysis followed by separation analysis using GC/MS, we can analyze materials that are insoluble in solvents, such as cross-linked polymer materials and thermosetting resins. 【Analysis Conditions】 ■ Sample Amount: 0.1 mg to several m ■ Temperature Range: 40 to 800℃ ■ Heating Atmosphere: He *For more details, please download the PDF or feel free to contact us.

  • Contract Analysis
  • MS analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

SIMS Analysis | PCOR-SIMS (High-Precision Secondary Ion Mass Spectrometry)

Correction of sensitivity coefficients and sputtering rates across all depths in response to changes in the sample matrix, enabling high-precision depth profile analysis.

PCOR-SIMS (Point by point Corrected SIMS) is an analytical method uniquely developed by EAG Laboratories based on SIMS, leveraging years of experience and expertise. It corrects the sensitivity coefficients and sputtering rates for all points in the depth direction in response to changes in the sample matrix, enabling the acquisition of highly accurate depth profiles. PCOR-SIMS is effective for evaluating trace elements and compositions in compound semiconductors, as well as for assessing ultra-shallow ion implantation distributions of elements such as B, As, and P.

  • Contract Analysis
  • Secondary ion mass spectrometer
  • Ion implantation equipment
  • MS analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

GCMS analysis of liquid crystal components

Comparison of components in liquid crystal panels using gas chromatography-mass spectrometry (GC-MS) is published!

This document introduces a comparison of components in PC monitors and digital clocks using gas chromatography-mass spectrometry (GC-MS). Liquid crystal displays contain small organic substances (liquid crystal molecules). These have evolved into molecular structures suitable for product characteristics due to technological innovations. Our company clarifies these differences at the molecular level using GC-MS, allowing us to confirm that the liquid crystal molecules are appropriate for their intended use and to check for the presence of impurities. [Contents] ■ Component comparison of PC monitors and digital clocks using GC-MS ■ Case studies of GC-MS analysis of liquid crystal components We compared the number of components and characteristics of segment-type liquid crystal displays (digital clocks) and color TFT liquid crystal displays (PC monitors). *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • MS analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Technical Report: Gas Analysis - GC, GC/MS Analysis

A case study of qualitative and quantitative analysis of volatile organic compounds and inorganic gases using GC and GC/MS.

Some volatile organic compounds and inorganic gases contain substances that can adversely affect the environment and human health. These substances, which are gaseous at room temperature and pressure, are typically analyzed qualitatively and quantitatively using GC or GC/MS. This document presents an example of measurement methods for methane, the main component of natural gas, carbon monoxide generated from automobile exhaust and incomplete combustion, and nitrous oxide, a substance that depletes the ozone layer. [Contents] ■ Methane ■ Carbon monoxide ■ Nitrous oxide *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Inspection
  • MS analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration